MMR可控連續變溫霍爾效應測試系統
測量半導體薄膜中載流子類型、載流子濃度、遷移率、電阻率、霍爾系數等參數.
? 溫控范圍可選
? 磁場強度可選
MMR Hall Effect Measurement System
controlled continuously variable temperature
MMR可控連續變溫霍爾效應測試系統
Temperature Compact table top design(簡潔桌上型設計)![]()
Two methods of contacting samples:(兩種樣品接觸法)
Spring Loaded probes(彈簧探針)
Wire Bonding with Harness(PCB引線治具)

TemperatureRanges Available:70K to 580K80K to 580K70K to 730K80K to 730KRoom temp to 730K
Magnet Ranges Available:5000 Gauss14000 Gauss
![]()
Information Provided
Carrier Mobility(載流子遷移率)Carrier Concentration(載流子濃度)Carrier Types (載體類型)n-type or p-type(N型或P型)Resistance Measurements(阻值)Hall Effect of a Magnetic Field(變磁場霍爾)Hall Effect of Temperature(變溫霍爾)