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航空復合材料的相控陣檢測復合材料相控陣檢測

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產(chǎn)品型號復合材料相控陣檢測

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產(chǎn)品簡介

復合材料的相控陣檢測探頭大鍛件大厚壁的相控陣檢測粗晶材料的相控陣檢測

詳細介紹

Linear arrays

High penetration / Wide scan linear arrays

Applications

Automated high-performance inspection of submerged parts: metal plates, bars, pipes, composite materials, forged parts, etc.

Principle & Advantages

The scanned length (L) is maximised by combining a large number
of elements (typically between 64 to 512) with the widest possible
inter-element pitch (p).

Electronic focusing can be combined with scanning, for example, to inspect at different depths. In general, electronic deflection is little used for this type of application.

Inspection time is reduced through the high speed of the electronic scanning combined with a large scanning width.
The scanning mechanism is simplified.

Standard Configurations:

Freq. (MHz)	Nb elts	Pitch p (mm)	Active size L x h (mm)	Housing size L x W x H (mm)*
10	64	0.5	32x10	40x16x35
10	128	0.5	64x10	75x20x40
5	64	1	64x15	75x20x40
5	128	1	128x15	140x25x45
2.25	128	1.5	192x15	205x30x45
2.25	64	2	128x20	140x30x35

*Indicative values

General Characteristics

Frequency from 300 kHz to 20 MHz
Unlimited number of elements, typically from 64 to 512
Versatile, Dynamic, Accuracy or Hard face acoustic technology
Ergonomic or basic housing
Good axial resolution and reduction of the unseen area beneath the surface thanks to a short pulse length
Reproducibility of the inspection because of the homogeneity of the elements of the same probe and the different probes of the same type
High reliability over time thanks to a design that is watertight and resistant to corrosion, compatible with permanent immersion under 1m of water

Options

Pre-focused active area (see below)
Captive screws of lateral flanges for wedge attachment
Integrated wedge
Housing adapted to the probe holder
Low profile and side cable for wheel probe
Halogen-free for nuclear environments
Customized cabling
Adaptation to a particular environment (temperature, pressure, radiation, chemical compatibility)

Mechanical Pre-focusing

On linear arrays, electronic focusing is possible only in the plane of incidence. However, in the perpendicular plane (passive aperture), it is possible to adjust focal depth and lateral resolution by using mechanical pre-focusing, by choosing the appropriate radius of curvature, active width (h) and water path.

Flat array

pre-focused array with various radiuses of curvature

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