IMA是一款可收集可見、紅外、近紅外范圍(400-1620nm）光譜和空間信息的高光譜顯微鏡。該系統能夠快速地對光致發光、電致發光、熒光、反射率和透射率進行成像。基于高通量的全局濾波器，IMA比傳統的點掃或線掃系統，采集速度更快，效率更高。
技術參數 | 可見光波段 | 近紅外波段 |
光譜范圍 | 400-1000nm | 900-1620nm |
光譜分辨率（FWHM） | ＜2nm | ＜4nm |
通道類型 | 連續可調 | 連續可調 |
空間分辨率 | 亞微米-與顯微鏡物鏡光闌相關 | 亞微米-與顯微鏡物鏡光闌相關
|
相機 | CCD,EMCCD,sCOMS | Photon公司砷鎵銦相機（ZephIR™ 1.7 or Alizé™ 1.7)） |
激發波長（最多三激光） | 405, 447, 532, 561, 660, 730, 785, 808 nm (其他波長可定制) | 405, 447, 532, 561, 660, 730, 785, 808 nm (其他波長可定制) |
顯微鏡 | 正置、倒置、科研級顯微鏡 | 正置、倒置、科研級顯微鏡 |
白光激發 | 透射、反射、汞燈、鹵素燈 | 透射、反射、汞燈、鹵素燈 |
觀測模式 | 熒光、暗場（油鏡或干鏡） | 熒光、暗場（油鏡或干鏡） |
應用案例
17-手性半導體單壁碳納米管的高光譜發光成像表征
高光譜顯微鏡搭配光學生物傳感器檢測大腸桿菌濃度
金納米粒子的高光譜暗場表征:識別和定位
鈣鈦礦光譜與空間信息分析
多晶銅銦二硫化電池的高光譜發光特性
用砷化鎵樣品進行法校準模塊測試
硅太陽能電池的高光譜發光成像
碳化硅缺陷的高光譜電致發光表征
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